Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Mukaida M., Miura M., Nakaoka K., Yoshizumi M., Yamada K., Mori N., Tada K., Yoshida J.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, TFA-MOD process, precursors, composition, critical caracteristics, critical current density, microstructure, fabrication
Awaji S., Watanabe K., Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Mukaida M., Nakaoka K., Yoshizumi M., Yamada K., Mori N., Miyanaga Y., Nanba M.
Awaji S., Watanabe K., Kiss T., Izumi T., Shiohara Y., Inoue M., Yamada Y., Yoshizumi M., Motoyama K.
Amemiya N., Nagaya S., Kashima N., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Mukoyama S., Yagi M., Masuda T., Ishiyama A., Yoshizumi M.
Ключевые слова: HTS, power transmission lines, YBCO, coated conductors, IBAD process, MOCVD process, cables three-in-one, REBCO, ac losses, experimental results, power equipment
Ключевые слова: HTS, coated conductors, Japan, review, YBCO, REBCO, long conductors, status
Ключевые слова: presentation, HTS, YBCO, coated conductors, REBCO, nanodoping, critical current density, angular dependence, TFA-MOD process, PLD process, fabrication, defects, critical current, homogeneity, long conductors, thickness dependence, angular dependence, critical current density, critical caracteristics, experimental results, pinning centers artificial, grain size, microstructure
Izumi T., Ito T., Takahashi Y., Yamada Y., Sutoh Y., Miura M., Nakaoka K., Yoshizumi M., Ichikawa H., HiranoH., Tobita H., Y.Shiohara
Ключевые слова: presentation, HTS, YBCO, coated conductors, TFA-MOD process, fabrication, precursors, high rate process, critical current density
Ключевые слова: Japan, HTS, coated conductors, review, YBCO, composition, long conductors, REBCO, Jc/B curves, angular dependence, critical current, homogeneity, ac losses, critical caracteristics, status
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, growth rate, microstructure, fabrication
Izumi T., Yoshizumi M., Miura M., Sutoh Y., Nakanishi T., Nakai A., Ichikawa Y., Yamada Y., Goto T., Yajima A., Aoki Y., Hasegawa T., Shiohara Y.
Izumi T., Shiohara Y., Mimura M., Sutoh Y., Miura M., Nakaoka K., Yoshizumi M., Nakai A., Nakanishi T., Ichikawa H.
Iijima Y., Saitoh T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Matsuda J., Miura M., Nakaoka K., Yoshizumi M., Nakai A., Nakanishi T.
Ключевые слова: HTS, coated conductors, buffer layers, PLD process, YBCO, TFA-MOD process, IBAD process, surface, nanoscaled roughness, fabrication
Goto T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Yajima A., Yoshinaka A., Miura M., Nakaoka K., Yoshizumi M.
Higashikawa K., Kiss T., Izumi T., Shiohara Y., Inoue M., Imamura K., Yamada Y., Miyata S., Nakao K., Chikumoto N., Ibi A., Yoshizumi M., Kato J., Matsekh A., Abiru K., Honda Y.
Ключевые слова: HTS, YBCO, coated conductors, ac losses, critical caracteristics, numerical analysis
Goto T., Izumi T., Shiohara Y., Kato T., Hirayama T., Sutoh Y., Yajima A., Miura M., Yoshizumi M., Yashima A.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, precursors, composition, critical current, Jc/B curves, growth rate, fabrication, presentation, critical caracteristics
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